ijaers social
facebook
twitter
Blogger
google plus

International Journal of Advanced Engineering, Management and Science


Overview of Testing Power Switches in VLSI Circuits

( Vol-1,Issue-2,May 2015 )

Author(s): Sami Venkatesh, Uday B, Sk Tabrace, S Premkumar



Total View : 680
Downloads : 13
Page No: 07-12
ijaems crossref doiDOI:

Keywords:

Power Gating, DFT(design for test), leakage power reduction, fault diagnosis, Multimode Switches

Abstract:

This paper presents a comparative discover of power switches. Power switches are increasingly becoming dominant leakage power reduction technique. Hence, fast and efficient DFT resolution for examination and diagnosis of power switches is far demanded to enable faster identification of possible faults and their locations. By employing effective discharge route design, that eliminates the potential of false examination and hence considerably cutting the price and discharge times. We validated the effectiveness of our proposed solution across SPICE simulations. In this paper we are going to discover the Complete overview of power switches.

Cite This Article:
Show All (MLA | APA | Chicago | Harvard | IEEE | Bibtex)
Share: