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International Journal of Advanced Engineering, Management and Science

Overview of Testing Power Switches in VLSI Circuits

( Vol-1,Issue-2,May 2015 )

Author(s): Sami Venkatesh, Uday B, Sk Tabrace, S Premkumar

Total View : 747
Downloads : 14
Page No: 07-12
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Power Gating, DFT(design for test), leakage power reduction, fault diagnosis, Multimode Switches


This paper presents a comparative discover of power switches. Power switches are increasingly becoming dominant leakage power reduction technique. Hence, fast and efficient DFT resolution for examination and diagnosis of power switches is far demanded to enable faster identification of possible faults and their locations. By employing effective discharge route design, that eliminates the potential of false examination and hence considerably cutting the price and discharge times. We validated the effectiveness of our proposed solution across SPICE simulations. In this paper we are going to discover the Complete overview of power switches.

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